Scattering from rough surfaces
Surface roughness scattering or interface roughness scattering is the elastic scattering of particles against a rough solid surface or imperfect interface between two different materials. This effect has been observed in clasical systems, such as microparticle scattering,[1] as well as quantum systems, where it arises electronic devices, such as field effect transistors and quantum cascade lasers.[2]
Classical description
In the classical mechanics framework, a rough surface, such as a machined metal surface, randomizses the probability distribution function governing the incoming particles, leading to net momentum loss of the particle flux. [3]
Quantum description
In the quantum mechanical framework, this scattering is most noticeable in confined systems, in which the energies for charge carriers are determined by the locations of interfaces. An example of such a system is a quantum well, which may be constructed from a sandwich of different layers of semiconductor. Variations in the thickness of these layers therefore causes the energy of particles to be dependent on their in-plane location in the layer.[4] Classification of the roughness at a given position, , is complex, but as in the classical models, it has been modelled as a Gaussian distribution by some researchers [5] This assumption may be formulated in terms of the ensemble average for some given characteristic height, , and correlation length, , such that
TYPES OF SCATTERING :
Selective Scattering : In selective Scattering scattering depends upon the wavelength of light.
Mie Scattering : In this size of the molecules is greater than the wavelength of light that results in non-uniform scaterring of light.
Electromagnetic Scattering : Electromagnetic waves are used in this form of Scattering .
Notes
- Sommerfeld, M., Huber, N. (1999) "Experimental analysis and modelling of particle-wall collisions." International Journal of Multiphase Flow 25(6), 1457–1489
- Valavanis, A.; Ikonić, Z.; Kelsall, R. W. (2008), "Intersubband carrier scattering in n- and p−Si/SiGe quantum wells with diffuse interfaces", Physical Review B, 77 (7): 075312, arXiv:0908.0552, Bibcode:2008PhRvB..77g5312V, doi:10.1103/PhysRevB.77.075312"CBSE Class 12th NCERT"
- Konan, N.A., Kannengieser, O., Simonin, O. (2009) "Stochastic modeling of the multiple rebound effects for particle-rough wall collisions" International Journal of Multiphase Flow 35(10), 933–945
- Prange, R. E.; Nee, Tsu-Wei (1968), "Quantum Spectroscopy of the Low-Field Oscillations in the Surface Impedance", Physical Review, 168 (3): 779–786, Bibcode:1968PhRv..168..779P, doi:10.1103/PhysRev.168.779
- Sakaki, H.; Noda, T.; Hirakawa, K.; Tanaka, M.; Matsusue, T. (1987), "Interface roughness scattering in GaAs/AlAs quantum wells", Applied Physics Letters, 51 (23): 1934–1936, Bibcode:1987ApPhL..51.1934S, doi:10.1063/1.98305